Custom IC Test Fixtures & Breakout Boards
Engineered for device programming, high-speed testing, and failure analysis.
We engineer custom IC test fixtures to address the critical challenges of testing tomorrow's technologies today. Each fixture is meticulously design for precise alignment and robust performance for complex IC packages and high-density configurations.
Our custom breakout boards and programming test fixtures reduce test variability, integrate with manual and automated systems, and improve durability with high-grade materials. Each fixture is custom made to fit your IC's exact specifications, delivering consistent and accurate results.

▪ Tailored Precision Engineering
Our custom IC test fixtures are designed to meet the operational specifications of your DUT and interfacing requirements set by your configuration, ensuring unparalleled accuracy while minimizing test variability.
▪ Seamless Integration
We offer adaptable solutions that fit seamlessly into both manual and automated testing environments, enhancing efficiency and throughput across diverse applications to reduce downtime and accelerate your testing process.
▪ High-Quality Manufacturing
Produced in the USA with advanced materials and rigorous quality checks, our fixtures are built for durability and consistent performance in real-world testing scenarios. Each fixture meets the highest standards for reliability and longevity.
▪ Dedicated Support and Service
Our expert team of engineers provides exceptional support and technical assistance for every IC test fixture we construct; from initial setup to ongoing maintenance, to ensure your testing operations are efficient and trouble-free.
Custom IC Test Fixtures & Breakout Boards

We engineer custom IC test fixtures to address the critical challenges of testing tomorrow's technologies today. We meticulously design our fixtures to provide precise alignment and robust performance for complex IC packages and high-density configurations.
They address pain points by reducing test variability, integrating with manual and automated systems, and improving durability with high-grade materials. Each fixture is custom made to fit your IC's exact specifications, delivering consistent and accurate results.
▪ Tailored Precision Engineering
Our custom IC test fixtures are designed to meet the operational specifications of your DUT and interfacing requirements set by your configuration, ensuring unparalleled accuracy while minimizing test variability.
▪ Seamless Integration
We offer adaptable solutions that fit seamlessly into both manual and automated testing environments, enhancing efficiency and throughput across diverse applications to reduce downtime and accelerate your testing process.
▪ High-Quality Manufacturing
Produced in the USA with advanced materials and rigorous quality checks, our fixtures are built for durability and consistent performance in real-world testing scenarios. Each fixture meets the highest standards for reliability and longevity.
▪ Dedicated Support and Service
Our expert team of engineers provides exceptional support and technical assistance for every IC test fixture we construct; from initial setup to ongoing maintenance, to ensure your testing operations are efficient and trouble-free.
Product Details & More
Here, you'll find helpful links, PDF downloads for manuals and brochures, and related blog posts. For further assistance, please contact our customer support team.
Here, you'll find helpful links, PDF downloads for manuals and brochures, and related blog posts. For further assistance, please contact our customer support team.
Device Programming Test Fixtures
Designed for benchtop setups where ICs are programmed with specific data or firmware. These programming test fixtures adhere to industry standards in interfacing, PCB design rules, and ensure reliable connections, ensuring effective and efficient programming operations.
Physical Customization
Our fixtures are designed to accommodate advanced IC packages, including ASICs (Application-Specific Integrated Circuits), SoCs (Systems on Chip), MCMs (Multi-Chip Modules), and FPGAs (Field-Programmable Gate Arrays). They feature precision-engineered sockets and adapters that provide secure, reliable connections while managing the unique dimensions and pin configurations of these complex packages.
Electrical Customization
Engineered to support key industry standards, our fixtures enhance programming performance by following strict PCB design guidelines and utilizing JEDEC standard components.
Additional Features:
- Integrated Test Points: Provides high-resolution test points for real-time monitoring and troubleshooting of programming signals and voltages.
- Heat Management: Includes package level thermal management features to dissipate heat and maintain optimal temperatures during programming.
- Automated System Compatibility: Designed to integrate with automated programming systems, enhancing throughput and efficiency in high-volume testing.
- Program chips on module: Make direct contact to devices soldered to PCB modules or access the programmable device through other connections on the module.
Our custom programming test fixtures combine advanced mechanical design with superior electrical features, ensuring reliable and efficient programming in accordance with industry standards.
High Speed Breakout Boards & IC Test Fixtures
Our high-speed breakout boards and fixtures are engineered to ensure seamless signal integrity across high-frequency applications, essential for precise evaluation and validation of cutting-edge ICs. These fixtures feature shielded connections and durable PCB designs that cater to the demanding requirements of high-speed testing environments.
Common test sockets include BGA, QFN, and LGA, with elastomeric and spring pin contacts optimized for minimal signal distortion. The PCB design focuses on controlled impedance and high-quality trace routing, ensuring low insertion loss and minimal crosstalk. Signals are routed to high-speed interfaces like BNC, Triax, and other SMA, SMP, and 2.92mm (K) Coax connectors.
Our breakout boards and fixtures work with a variety of bench test equipment, including vector network analyzers, spectrum and impedance analyzers, oscilloscopes and more, making them a single versatile solution for multiple testing scenarios. The robust assemblies with sensible designs for ease of use ensure reliable connections during repeated testing cycles, making them ideal for both benchtop and automated test systems. Designed with input from experienced test engineers, our high-speed breakout boards provide the accuracy and consistency needed to meet stringent industry standards.
Failure Analysis IC Test Fixtures
Featuring low profile and compact form factors to observe tight working areas while providing the greatest level of device access during test and inspection. Instrumental in fault localization towards root-cause failure, these mobile fixtures can be used with high end inspection tools while connected to popular benchtop measurement tools. See our 950 Series and RSK Series fixtures for additional standardized designs.
- Physical Customization: Fully assembled IC test fixtures for failure analysis are customized to fit on your bench or mount directly to your advanced inspection tools. All fixtures are designed provide precision alignment at every stage between the DUT and inspection tool, crucial for accurately identifying defects or anomalies at the nano scale. See our semi-custom test sockets for FA centric design options that give you greater working areas, bring your device in contact with Solid Immersion Lenses, provide full surface visibility to your WLCSP packages, and more.
- Thermal Control: Integrated device level heatsinks and heater blocks let you test at elevated temperatures to introduce stress, monitor heat distribution and detect overheating issues within the die.
- Support for Mounting Brackets: For use on common stages, backplates for vacuum chucks, or within X-Ray or EMMI scopes, RTI fixtures sit securely in place while you perform high resolution and delicate measurements on the DUT.
- Automated System Compatibility: Integrates with MultiTrace automated curve tracers and other diagnostic systems for enhanced analysis efficiency.
Some common FA inspection methods our fixtures are designed for include:
- Scanning Electron Microscopes (SEMs): SEMs provide high-resolution imaging for detailed examination of semiconductor devices. Direct mounting of test sockets and PCBs allows for precise positioning and stable imaging, crucial for identifying minute defects or irregularities in materials.
- Focused Ion Beam Systems (FIBs): FIB systems are used for both imaging and material modification at the micro and nano scale. They require the DUT to be securely mounted to ensure precision during cross-sectioning or circuit editing.
- Probe Stations: Used for electrical probing of semiconductor devices, probe stations require direct mounting of PCBs and test sockets to facilitate stable and accurate contact with the device under test. These are commonly used in conjunction with microscopes or RF measurement tools.
- X-ray Inspection Systems (e.g., X-ray Tomography): X-ray systems are used to inspect the internal structure of semiconductor devices without damaging them. Direct mounting ensures that the DUT is securely held in place for accurate 3D imaging and defect analysis.