Take Your Curve Tracing to the Next Level with DataTrace

Take your semiconductor testing to the next level with DataTrace Labs.

Welcome to DataTrace Labs

Please click on the images below to expand. 

Advanced Data Extraction Features in DataTrace Labs

Comprehensive Data Access:

• All-Inclusive Data Retrieval: Gain access to every piece of data in your curve trace files. This ensures no detail is missed, providing a complete picture of your semiconductor testing results.
• Detailed Analysis: With the ability to review all data points, you can perform a more in-depth analysis, identifying trends and anomalies that might otherwise go unnoticed.

Voltage and Current Sample Extraction:

• Selective Sampling: Extract specific voltage or current samples into spreadsheet files. This feature is crucial for isolating particular data points for further analysis or documentation.
• Customizable Reports: Create detailed reports by exporting these samples, facilitating better data presentation and sharing with stakeholders.

Unit Customization:

• Flexible Data Display: Choose to display data with or without units. This flexibility allows you to format your data according to your preferences or the requirements of your analysis.
• Improved Clarity: By customizing how data is presented, you can enhance the clarity and readability of your reports.

Powerful Search Functionality:

• Effortless Data Navigation: Quickly find specific data points, such as leakage current at a given voltage, using advanced search capabilities.
• Time Saving: This feature significantly reduces the time spent manually searching through large datasets, allowing you to focus on analysis and decision-making.

Benefits of These Features:

• Enhanced Reporting: The ability to compile data for bar charts and construct ATE-like data-logs enhances the look and professionalism of your reports.
• Custom Test Solutions: For tests that may not display well graphically, these features provide a reliable solution for capturing and analyzing data.
• Improved Efficiency: Streamlined data extraction processes help improve overall testing efficiency, allowing you to conduct thorough and effective analyses in less time.

Why Choose DataTrace Labs?

Upgrading to DataTrace Labs provides semiconductor testing professionals with advanced tools that enhance testing efficiency and report accuracy. The software meets modern semiconductor testing demands with comprehensive data access, selective sampling, customizable unit displays, and powerful search functionalities. These features collectively contribute to a more streamlined and effective testing workflow, making DataTrace Labs an indispensable tool for professionals in the field.

Ready to boost your semiconductor testing with DataTrace Labs? Request a demo now and unlock the full potential of your data analysis.

Optimize Your Semiconductor Testing with DataTrace Max.

Welcome to DataTrace Max

Please click on images below to expand. 

batch compare setup screen

batch compare results grid

High Efficiency Tools in DataTrace Max

Test Sequencer:

• Flexible Test Plans: Configure test sequences having various test conditions in each step. Efficiently collect data from large numbers of devices with the fewest clicks.
• Test Results on the Fly: The test run screen shows a running log of test results with pass fail results. This live view helps you devide if retesting is needed
• Sequence any Test Setting: Unpowered, powered, IDDQ and latchup, or custom no problem

Advanced Comparison Tools:

• Simultaneous Analysis: DataTrace Max allows for the simultaneous comparison of hundreds of curve trace files. This feature significantly speeds up the analysis process, enabling you to handle large datasets efficiently.
• Enhanced Analysis Capabilities: By comparing multiple files at once, you can identify patterns and discrepancies across batches, which is crucial for quality control and troubleshooting.

Auto-Generate Control Files:

• Averaging Data: The software can automatically generate control files by averaging the data from multiple trace files. This simplifies the process of creating reference points, which are essential for benchmarking and comparison.
• Streamlined Workflow: This automation reduces manual input and potential errors, ensuring more accurate and reliable control files.

Bar Chart Creation:

• Visual Summarization: DataTrace Max can create bar charts that summarize failures and key metrics. These charts provide a clear, visual representation of your data, making it easier to interpret results and communicate findings.
• Quick Insights: Bar charts help quickly identify trends and outliers, facilitating faster decision-making.

Detailed Comparison Reports:

• Color-Coded Reports: The software generates detailed comparison reports that use color-coding to highlight differences and similarities across data sets. This visual aid makes it easier to spot variances and understand their implications.
• Comprehensive Analysis: These reports provide a thorough comparison, identifying open, shorted or leakage curves, which is invaluable for in-depth analysis and reporting.

Key Applications of High Efficiency Testing Tools:

Failure Analysis:

• Repeatability and Reproducibility: Test sequences allow you to define a group of tests that you can do each time you return to a particular part number. This enables reliable and efficient setup and comparison to previous results you know have the same test conditions.

Counterfeit IC Detection:

• Rapid Identification: The batch comparison tools in DataTrace Max enable quick and accurate identification of counterfeit components by highlighting inconsistencies in trace data.
• Enhanced Security: This capability is crucial for maintaining the integrity and reliability of semiconductor supply chains.

Package Reliability:

• Reliability Assessment: Use detailed reports to assess the reliability of semiconductor packages. Identifying weaknesses or potential failure points ensures higher quality and durability of the final product.
• Preventive Measures: Early detection of issues allows for proactive measures to be taken, reducing the risk of field failures.

OSAT Labs:

• Fast and Efficient: Enjoy obtaining curve trace results faster than any other method
• Process Optimization: Outsourced Semiconductor Assembly and Test (OSAT) labs can optimize their processes using the batch comparison tools, enhancing overall efficiency and output quality.
• Data-Driven Decisions: Detailed comparisons provide the data needed to make informed decisions about process improvements and quality assurance.

High-Volume Analysis Labs:

• Efficiency Improvement: For labs handling large volumes of data, these tools reduce downtime by speeding up the analysis process and minimizing the time required for manual comparisons.
• Enhanced Throughput: Increased efficiency leads to higher throughput, allowing labs to process more data in less time without compromising accuracy.

Why Choose DataTrace Max?

DataTrace Max is essential for semiconductor testing professionals needing to test more than a few devices at a time or who want to optimize repeatability with advanced test sequences. When you upgrade to DataTrace Max, you gain a powerful solution that boosts testing efficiency, accuracy, and report professionalism. To meet the high demands of modern semiconductor testing, DataTrace Max is equipped with the tools needed for Maximum Efficiency.

Upgrade to DataTrace Max today and experience the difference it can make in your semiconductor testing workflow! Request a demo.

Boost Testing Capabilities with DataTrace Max & Latch-Up.

Welcome to DataTrace Max & Latch-Up

Experience the ultimate semiconductor testing with DataTrace Max & Latch-Up, our top package. This tier includes all the powerful features of DataTrace Labs and DataTrace Max, plus crucial latch-up testing capabilities. DataTrace Max & Latch-Up is specifically designed for reliability and failure analysis engineers to ensure devices meet the highest standards and identify potential failure modes accurately.

Specialized Latch-Up Testing in DataTrace Max & Latch-Up

I-Test (Current Pulse Testing):

• Purpose: The I-Test is designed to assess the robustness of a semiconductor device by subjecting its input, output, and I/O pins to increasing current pulses. This test helps identify potential latch-up conditions, which can lead to device failure.
• Methodology: During the I-Test, current pulses are gradually increased while monitoring the supply current (IDD) when they are removed. Sustained high current in the supply current indicate the presence of latch-up, providing valuable insights into the device's reliability.
• Benefits: This test helps engineers pinpoint specific failure modes related to latch-up, allowing for targeted improvements in device design and manufacturing processes.

VDD Overvoltage Test:

• Purpose: The VDD Overvoltage Test evaluates a device's tolerance to overvoltage conditions, ensuring it can handle unexpected power surges and EMI without compromising performance.
• Methodology: In this test, the power pins of the device are subjected to a momentary overvoltage condition. After returning to standard operating conditions, the supply current (IDD) is monitored to ensure it remains within acceptable levels.
• Benefits: This test helps identify vulnerabilities to overvoltage, which can be critical for applications where power fluctuations are common. It ensures devices can withstand and recover from overvoltage events without permanent damage.

Graphical Representation and Reporting:

• Visual Insights: Both the I-Test and VDD Overvoltage Test results are graphically represented, making it easy for engineers to interpret the data. Visual graphs provide clear indications of pass or fail conditions.
• Summarized Reports: Detailed, color-coded reports summarize the test results, highlighting any deviations from expected performance. These reports offer quick pass-or-fail insights, helping engineers make informed decisions about device compliance and areas needing attention.

Why Choose DataTrace Max & Latch-Up?

DataTrace Max & Latch-Up offers unparalleled precision and comprehensive features for semiconductor testing professionals. This advanced package combines DataTrace Labs and DataTrace Max capabilities with specialized latch-up testing for reliable devices. The I-Test and VDD Overvoltage Test help identify potential failure modes accurately. Graphical representations and color-coded reports make data interpretation and communication efficient.

Opting for DataTrace Max & Latch-Up gives you a solution that enhances the quality of your reports and ensures thorough analysis. This package is specifically designed to meet the most rigorous testing requirements, making it an invaluable asset for achieving outstanding results in semiconductor testing.

Ready to take your semiconductor testing to the next level with DataTrace Max & Latch-Up? Request a demo and start leveraging the power of our most advanced package.

Analyze Anywhere with DataTrace View

Welcome to DataTrace View

Introducing DataTrace View, the perfect solution for semiconductor testing professionals who need flexibility and mobility in their data analysis. View basic is included with all new MultiTrace and software upgrade customers. The level of View will match your full version of DataTrace with hardware controls.

DataTrace View includes all the powerful analyzing features of our other packages but without the need to control RTI's curve tracer hardware. This package is ideal for users who want to work from anywhere—whether you're at your desk, in a coffee shop, or on the go.

Key Features of DataTrace View

DataTrace View is designed to provide you with comprehensive data analysis capabilities, no matter where you are. Here's what you can expect:

• Simplified User Interface: All controls to configure the hardware are hidden, this version is intended for analysis of data only and may be installed on any PC
• Upgradable: File viewing can be enhanced by upgrading to higher levels of DataTrace Available in Basic, Labs and Max versions lacking only test setup
• Comprehensive Data Analysis: Enjoy all the robust data analysis tools of our other packages, including file viewing, array printing, advanced property display, file comparison, and graph annotation.
• Flexibility and Mobility: Analyze your data on any computer, even those not connected to the curve tracer hardware. This means you can work on your laptop while relaxing at a coffee shop or comfortably sitting at your desk.
• Report Building and Writing: Spend your time building and writing detailed reports without being tethered to the hardware. DataTrace View allows you to focus on analysis and documentation, enhancing your productivity and efficiency.

Why Choose DataTrace View?

DataTrace View offers the ultimate flexibility for professionals who need to analyze semiconductor testing data away from the lab. Here's why DataTrace View is the ideal choice for your needs:

• Work from Anywhere: With DataTrace View, you're not tied to the lab. Whether you're at a coffee shop, traveling, or at home, you can access and analyze your data without needing a direct connection to the curve trace hardware.
• Full Analytical Capabilities: Benefit from the same powerful analytical tools found in our other packages. You can view, compare, annotate, and print your data with ease.
• Enhanced Productivity: Free yourself from the constraints of hardware connections and use your time more effectively. Build and write reports wherever you are, making your workflow smoother and more efficient.

Who Can Benefit from DataTrace View?

DataTrace View is perfect for professionals who need to:

• Busy Lab: Leave the tester hardware for another engineer to work while you move the data to a computer and seat you are more comfortable in.
• Analyze Data Remotely: If your role involves analyzing data outside of the lab or office, DataTrace View provides the perfect solution.
• Increase Mobility: For those who travel frequently or work from various locations, DataTrace View ensures that you have access to your analysis tools at all times.
• Enhance Work Flexibility: If you prefer working in different environments or need to manage your work-life balance better, DataTrace View gives you the freedom to choose where and when you work.

Ready to improve your data analysis flexibility with DataTrace View? Request a demo today!

Unlock Customization with DataTrace SDK Kit

SDK kit must be grouped with DataTrace Max because it offers access to all capabilities at a low level.

Welcome to DataTrace SDK Kit

Take your semiconductor testing to new heights with DataTrace SDK Kit. This powerful package is designed for companies that require a high level of customization and flexibility in their testing applications. With API (Application Programmer Interface) access, your team can develop bespoke solutions tailored to your unique testing needs, making DataTrace SDK Kit the ultimate tool for advanced users. (Programming experience required, License requires NDA)

Key Features of DataTrace SDK Kit

The DataTrace SDK Kit empowers your team to innovate and optimize your testing processes by providing:

• API Access: Gain full access to our robust APIs, allowing your developers to write custom code and create applications that integrate seamlessly with DataTrace. Access to all controls from all menus including data extraction code and data formats.
• Custom Application Development: Develop bespoke applications tailored to your specific testing requirements. This flexibility ensures that your tools can evolve with your needs, providing unmatched adaptability.
• Enhanced Testing Solutions: Create solutions that better suit your company's unique testing processes, improving efficiency, accuracy, and productivity.
  • For example: Custom report generator, Custom test configurator, interface to robotic handler, global test conditions library, centralized data sharing among global labs sites, more.

Why Choose DataTrace SDK Kit?

DataTrace SDK Kit is not for the average engineer; it's designed for advanced users who need to push the boundaries of what's possible in semiconductor testing. C++ or similar programming experience is required. Here's why DataTrace SDK Kit is the ideal choice for your company:

• Tailored Solutions: With API access, your team can build custom applications that address specific testing challenges and requirements unique to your operations.
• Enhanced Integration: Ensure seamless integration with your existing systems and workflows, creating a cohesive and efficient testing environment.
• Future-Proofing: Develop applications that can be updated and modified as your testing needs evolve, ensuring long-term value and adaptability.

Who Can Benefit from DataTrace SDK Kit?

DataTrace SDK Kit is perfect for companies and teams that:

• Require Customization: If off-the-shelf software doesn't meet all your needs, DataTrace SDK Kit allows you to create custom solutions that fit perfectly within your workflows.
• Have In-House Development Capabilities: Companies with a software development team or a talented member can fully leverage the capabilities of the SDK Kit to build advanced applications.
• Need Advanced Testing Solutions: For teams that face complex and unique testing scenarios, the SDK Kit provides the tools to create tailored applications that enhance testing accuracy and efficiency.

Join the leading companies that trust DataTrace SDK Kit for their advanced testing needs. Unlock the full potential of your semiconductor testing with custom applications built specifically for your processes.

Ready to customize your semiconductor testing with DataTrace SDK Kit? Contact us today and start developing bespoke applications tailored to your needs.

Comprehensive Testing Applications with DataTrace

DataTrace leverages the use of MTForms and built in DTForms to configure most tests. Other custom test setups are possible by configuring the menus directly.

Unpowered Curve Tracing: Revealing Hidden Faults Safely

Unpowered curve tracing is a crucial technique for investigating the electrical connections beneath a device's physical pins without applying power, making it an invaluable tool for uncovering hidden faults. This method detects Opens, Shorts, and Current Leakage (OSL) that may arise from various issues such as Electrical Overstress (EOS), Electrostatic Discharge (ESD) damage, latch-up events, manufacturing defects, and handling damage. To protect compromised IC structures, pins are traced at minimal voltage and current levels. When needed, higher power settings can be applied for more detailed analysis.

Read more about Unpowered Curve Tracing here.

Powered Curve Tracing: Exposing Complex Defects with Precision

Powered curve tracing efficiently diagnoses devices by applying power to up to four domains, analyzing all pins under conditions of up to 15V and 1A. This method requires only basic datasheet details, bypassing the need for extensive functional data. Each pin's powered analysis through IV curves provides critical information, including diode protection, drive current, and leakage, revealing defects such as IDDQ variations, I/O functionality issues, and internal damage not detectable in unpowered tracing. This technique allows for direct failure analysis and validation of datasheet specifications, offering deeper insights into complex defects.

Read more about Powered Curve Tracing here.

Simplified IDDQ Testing Insights

The Supply Current (IDDQ) method is a streamlined approach to powered curve tracing, effective for both digital and analog devices with bipolar supplies. It simplifies analysis by providing either a single measurement or a curve showing how IDD varies across different devices. Users can choose between the Single Point method, which powers all VDD domains and sets inputs to a specified logic level, or the Ramp VDD method, which varies one VDD domain's voltage while keeping others fixed, to gain clear insights into device performance.

Read more about Supply Current (IDDQ) here.

Latch-Up: Locking Down Device Reliability

Latch-up testing is a specialized feature available only in DataTrace Max + Latch-Up, essential for reliability and failure analysis engineers. This testing ensures devices meet shipping standards and identify potential failure modes. The process includes two main tests: the I-Test and VDD overvoltage. The I-Test subjects input, output, and I/O pins to increasing current pulses while monitoring supply current for unusual spikes. The VDD overvoltage test momentarily subjects power pins to excess voltage and then checks for normal IDD levels upon returning to standard conditions. Results from both tests are graphically represented and summarized in reports, providing clear pass-or-fail insights.

Read more about Latch-Up here.

Custom Setups:

Using a standardized 4 step process users users can configure Connections, Settings Measurements and Display the data in a wide range of configurations. Menus driven settings screen allow you to configure every aspect of the test allowing for the most flexibility. Less common tests for Op Amp, Transistor, Transfer function etc are all possible. Connect up to 8 sources to any pin or pins and measure any voltage or current to display on the 3 axis graph plus colors and selectors to express more than 3 variables.

Explore these powerful applications offered across all levels of DataTrace to enhance your semiconductor testing and analysis. Whether you're working with unpowered or powered curve tracing, IDDQ testing, or advanced latch-up analysis, DataTrace provides the tools you need to achieve precise and reliable results.

Ready to see DataTrace in action?Request a demo today and discover how our comprehensive testing solutions can transform your semiconductor analysis.

Recent Posts